In this contribution, we present a measurement system for material characterization in the millimeter-wave range that requires extremely small amounts of sample material. With the help of a dielectric waveguide, it is possible to measure the complete S-parameters with only one port. Fundamentals regarding dielectric waveguides and algorithms are explained, which form the basis of the measurement system. Within the scope of this work, an existing waveguide system was extended and optimized. In addition, two algorithms were implemented to determine permittivity. Finally, measurements were carried out to prove the function of the measurement setup and compared to existing measurement setups.

中文翻译：

---

基于介电波导的 W 波段材料表征的紧凑型测量装置

在这篇文章中，我们提出了一种用于毫米波范围内材料表征的测量系统，该系统需要极少量的样品材料。借助电介质波导，只需一个端口即可测量完整的 S 参数。解释了有关介电波导和算法的基础知识，它们构成了测量系统的基础。在这项工作的范围内，现有的波导系统得到了扩展和优化。此外，实施了两种算法来确定介电常数。最后，进行测量以证明测量装置的功能，并与现有测量装置进行比较。