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Microwave Coincidence Imaging Based on Attributed Scattering Model
IEEE Signal Processing Letters ( IF 3.2 ) Pub Date : 7-29-2022 , DOI: 10.1109/lsp.2022.3195085
Kaicheng Cao 1 , Yongqiang Cheng 1 , Qingping Liu 1 , Hongqiang Wang 1
Affiliation  

In this letter, a novel microwave coincidence imaging (MCI) method based on the attributed scattering model (ASM) is proposed. Unlike the classical MCI model which assumes the target as a set of discrete scatterers, the ASM-based MCI equation contains three kinds of reference matrices corresponding to the point-scatterers (PSs), the line-segment-scatterers (LSSs) and the rectangular-plate-scatterers (RPSs), respectively. Hence the ASM-based MCI could resolve richer information about the object geometries. By solving the imaging equation via the alternating direction method of multipliers (ADMM) algorithm, the scattering coefficients will be obtained and the target can be reconstructed according to the presetting parameter sets. Meantime, the ASM-based MCI also earns the superresolution ability like the classical MCI, which is brought in by the temporal-spatial orthogonal radiation field. Simulations and experiment are carried out to demonstrate the performance and superresolution ability of proposed method. The ASM-based MCI makes contributions to the progress of radar forward-looking imaging theory and technology.

中文翻译:


基于属性散射模型的微波符合成像



在这封信中,提出了一种基于归因散射模型(ASM)的新型微波符合成像(MCI)方法。与将目标假设为一组离散散射体的经典 MCI 模型不同,基于 ASM 的 MCI 方程包含三种参考矩阵,分别对应于点散射体(PS)、线段散射体(LSS)和矩形散射体。 -分别是板散射体(RPS)。因此,基于 ASM 的 MCI 可以解析有关对象几何形状的更丰富的信息。通过交替方向乘子法(ADMM)算法求解成像方程,得到散射系数,并根据预设的参数集重建目标。同时,基于ASM的MCI也获得了与经典MCI一样的超分辨能力,这是由时空正交辐射场带来的。进行了仿真和实验来证明所提出方法的性能和超分辨率能力。基于ASM的MCI为雷达前视成像理论和技术的进步做出了贡献。
更新日期:2024-08-26
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