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Dust removal from a variety of surface materials with multiple electron beams
Acta Astronautica ( IF 3.1 ) Pub Date : 2022-08-03 , DOI: 10.1016/j.actaastro.2022.07.047
B. Farr , X. Wang , J. Goree , I. Hahn , U. Israelsson , M. Horányi

Dust mitigation is one of the technical challenges to overcome for future lunar surface exploration. In our previous work, a new electron beam (e-beam) mitigation technology was introduced to remove dust particles from protected surfaces through an electrostatic mechanism developed based on a Patched Charge Model. This model shows that the emission and re-absorption of e-beam induced secondary electrons inside microcavities between dust particles can result in large charges on the particles and their subsequent ejections from the surface due to strong repulsive forces. It was shown that, due to random orientations of microcavities, varying the e-beam incident angle by rotating the sample surface can cause more microcavities to be exposed, thereby improving the cleaning effectiveness. In this paper, we present and test a new configuration to implement varying the beam angle. Here multiple e-beam sources are aimed at different angles simultaneously at a sample surface that is fixed in place. A large variety of surface material samples are tested to demonstrate the e-beam technology's application scenarios, including both insulating samples (spacesuit, glass, a photovoltaic (PV) panel, Kapton tape, thermal blanket and anodized aluminum) and a conducting sample (aluminum). It is shown that the multiple e-beam source configuration improves cleaning effectiveness by 10–30% in comparison to a single fixed beam and sample. Most of the insulating samples achieve 80–90% cleanliness after only the 2–3 min beam exposure, except for the PV panel that shows 50% cleanliness. The conducting aluminum sample shows relatively low cleanliness at 35–45% likely due to the attractive Coulomb mirror force between the charged dust and aluminum surface. Finally, various e-beam configurations are suggested depending on application scenarios.



中文翻译:

使用多个电子束从各种表面材料中除尘

减少尘埃是未来月球表面探索需要克服的技术挑战之一。在我们之前的工作中,引入了一种新的电子束(e-beam)缓解技术,通过基于补丁电荷模型开发的静电机制从受保护的表面去除灰尘颗粒。该模型表明,电子束诱导的二次电子在尘埃颗粒之间的微腔内的发射和再吸收会导致颗粒上产生大量电荷,并随后由于强大的排斥力从表面喷出。结果表明,由于微腔的随机取向,通过旋转样品表面改变电子束入射角可以使更多的微腔暴露出来,从而提高清洁效果。在本文中,我们提出并测试了一种新的配置来实现改变光束角度。在这里,多个电子束源以不同的角度同时瞄准固定在适当位置的样品表面。测试了大量表面材料样品以展示电子束技术的应用场景,包括绝缘样品(宇航服、玻璃、光伏(PV)面板、Kapton 胶带、热毯和阳极氧化铝)和导电样品(铝)。结果表明,与单个固定光束和样品相比,多电子束源配置将清洁效率提高了 10-30%。大多数绝缘样品仅在 2-3 分钟的光束照射后即可达到 80-90% 的清洁度,但光伏面板的清洁度为 50%。由于带电灰尘和铝表面之间的库仑镜吸引力,导电铝样品的清洁度相对较低,可能为 35-45%。最后,根据应用场景建议各种电子束配置。

更新日期:2022-08-03
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