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High-Resolution Time-Correlated Single-Photon Counting Using Electro-Optic Sampling
Laser & Photonics Reviews ( IF 9.8 ) Pub Date : 2022-07-20 , DOI: 10.1002/lpor.202100635 Benjamin Crockett 1 , James van Howe 1, 2 , Nicola Montaut 1 , Roberto Morandotti 1 , José Azaña 1
Laser & Photonics Reviews ( IF 9.8 ) Pub Date : 2022-07-20 , DOI: 10.1002/lpor.202100635 Benjamin Crockett 1 , James van Howe 1, 2 , Nicola Montaut 1 , Roberto Morandotti 1 , José Azaña 1
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A simple, practical method based on electro-optic gating is experimentally shown to improve the temporal resolution of single-photon detection by more than 16 times. Delay times between ultrafast single photons and a reference clock are stretched by a desired programmable sampling gate factor, allowing reconstruction of delay histograms with ≈0.001 photons per pulse to within 60 ps. By transferring the bandwidth of RF electronics to single-photon counting, complex single-photon signals with large time-bandwidth products > 2000 are temporally stretched up so that they can be resolved by slow detectors, irrespective of the quality of the detector instrument response function. This method is also applied to biphotons, in order to reconstruct the 2D histogram of joint detection delays with 15 times better resolution. The phenomenon of nonlocal dispersion, which is not resolvable directly with the slow detectors, is then observable to within the 98 ps level. The proof-of-concept demonstration uses off-the-shelf commercial fiber-integrated LiNbO3 modulators and RF electronics, and the method is readily integrable on-chip and to speeds >100 GHz, offering a practical solution to ultrafast time-correlated single-photon counting beyond the research laboratory.
中文翻译：
使用电光采样的高分辨率时间相关单光子计数
实验表明，一种基于电光门控的简单实用方法可将单光子检测的时间分辨率提高 16 倍以上。超快单光子和参考时钟之间的延迟时间被所需的可编程采样门因子延长，允许以每脉冲 0.001 个光子将延迟直方图重建到 60 ps 以内。通过将射频电子设备的带宽转移到单光子计数，具有大于 2000 的大时间带宽积的复杂单光子信号在时间上被拉伸，以便它们可以被慢速探测器解析，而与探测器仪器响应函数的质量无关. 该方法也适用于双光子，以便以 15 倍的分辨率重建联合检测延迟的 2D 直方图。非局部色散现象不能直接用慢速探测器解决，然后可以在 98 ps 水平内观察到。概念验证演示使用现成的商用光纤集成 LiNbO3 个调制器和射频电子器件，该方法易于在芯片上集成，速度 >100 GHz，为研究实验室之外的超快时间相关单光子计数提供了实用的解决方案。
更新日期：2022-07-20
中文翻译：
使用电光采样的高分辨率时间相关单光子计数
实验表明，一种基于电光门控的简单实用方法可将单光子检测的时间分辨率提高 16 倍以上。超快单光子和参考时钟之间的延迟时间被所需的可编程采样门因子延长，允许以每脉冲 0.001 个光子将延迟直方图重建到 60 ps 以内。通过将射频电子设备的带宽转移到单光子计数，具有大于 2000 的大时间带宽积的复杂单光子信号在时间上被拉伸，以便它们可以被慢速探测器解析，而与探测器仪器响应函数的质量无关. 该方法也适用于双光子，以便以 15 倍的分辨率重建联合检测延迟的 2D 直方图。非局部色散现象不能直接用慢速探测器解决，然后可以在 98 ps 水平内观察到。概念验证演示使用现成的商用光纤集成 LiNbO3 个调制器和射频电子器件，该方法易于在芯片上集成，速度 >100 GHz，为研究实验室之外的超快时间相关单光子计数提供了实用的解决方案。
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