Defect Engineering for High Performance and Extremely Reliable a-IGZO Thin-Film Transistor in QD-OLED (Adv. Electron. Mater. 7/2022),Advanced Electronic Materials

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Defect Engineering for High Performance and Extremely Reliable a-IGZO Thin-Film Transistor in QD-OLED (Adv. Electron. Mater. 7/2022)
Advanced Electronic Materials ( IF 5.3 ) Pub Date : 2022-07-19 , DOI: 10.1002/aelm.202270036
Young‐Gil Park , Dong Yeon Cho , Ran Kim , Kang Hyun Kim , Ju Won Lee , Doo Hyoung Lee , Soo Im Jeong , Na Ri Ahn , Woo‐Geun Lee , Jae Beom Choi , Min Jung Kim , Donghyun Kim , Seunghee Jin , Dong Geun Park , Jungchun Kim , Saeyan Choi , Seain Bang , Jae Woo Lee