X-ray Raman Scattering: A Hard X-ray Probe of Complex Organic Systems,Chemical Reviews

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X-ray Raman Scattering: A Hard X-ray Probe of Complex Organic Systems
Chemical Reviews ( IF 51.4 ) Pub Date : 2022-06-23 , DOI: 10.1021/acs.chemrev.1c00953
Rafaella Georgiou _{1,

2} , Christoph J Sahle ₃ , Dimosthenis Sokaras ₄ , Sylvain Bernard ₅ , Uwe Bergmann ₆ , Jean-Pascal Rueff _{2,

7} , Loïc Bertrand ₈

Affiliation

This paper provides a review of the characterization of organic systems via X-ray Raman scattering (XRS) and a step-by-step guidance for its application. We present the fundamentals of XRS required to use the technique and discuss the main parameters of the experimental set-ups to optimize spectral and spatial resolution while maximizing signal-to-background ratio. We review applications that target the analysis of mixtures of organic compounds, the identification of minor spectral features, and the spatial discrimination in heterogeneous systems. We discuss the recent development of the direct tomography technique, which utilizes the XRS process as a contrast mechanism for assessing the three-dimensional spatially resolved carbon chemistry of complex organic materials. We conclude by exposing the current limitations and provide an outlook on how to overcome some of the existing challenges and advance future developments and applications of this powerful technique for complex organic systems.

中文翻译：

X 射线拉曼散射：复杂有机系统的硬 X 射线探测器

本文回顾了通过 X 射线拉曼散射 (XRS) 表征有机系统及其应用的分步指南。我们介绍了使用该技术所需的 XRS 基础知识，并讨论了实验装置的主要参数，以优化光谱和空间分辨率，同时最大化信背景比。我们回顾了针对有机化合物混合物的分析、次要光谱特征的识别以及异构系统中的空间辨别的应用。我们讨论了直接断层扫描技术的最新发展，该技术利用 XRS 过程作为对比机制来评估复杂有机材料的三维空间分辨碳化学。

更新日期：2022-06-23

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