Cables headed with crimped lugs are frequently used in test laboratories in temperature rise tests carried out to validate electrical devices. The increase in the electrical resistance of the crimped connections can cause high dissipation of power and heat during these tests, impairing their outcome. This work evaluates the effect of thermal stresses on the resistance and on the dissipated power of crimped connections. This resistance was found to be more sensitive to thermal stresses than to mechanical ones analysed in a previous work. A limit of the dissipated power from crimped connections during temperature rise tests was estimated to be about 4 W corresponding to a crimp resistance of 24 μΩ for tests made at 400 A. Respecting these limits could avoid unnecessary rejections of equipment under test.

带有压接接线片的电缆经常在测试实验室中用于验证电气设备的温升测试。在这些测试期间，压接连接电阻的增加会导致功率和热量的大量耗散，从而损害其结果。这项工作评估了热应力对电阻和压接连接耗散功率的影响。发现这种电阻对热应力比对先前工作中分析的机械应力更敏感。在温升测试期间，压接连接的耗散功率限制估计约为 4 W，对应于在 400 A 下进行的测试的压接电阻为 24 μΩ。遵守这些限制可以避免不必要的拒绝被测设备。