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Fully Microstrip Three-Port Circuit Bandpass NGD Design and Test
IEEE Design & Test ( IF 2 ) Pub Date : 2022-04-01 , DOI: 10.1109/mdat.2022.3164337 Blaise Ravelo 1 , Alexandre Douyere 2 , Yang Liu 3 , Wenceslas Rahajandraibe 4 , Fayu Wan 1 , George Chan 5 , Mathieu Guerin 4
IEEE Design & Test ( IF 2 ) Pub Date : 2022-04-01 , DOI: 10.1109/mdat.2022.3164337 Blaise Ravelo 1 , Alexandre Douyere 2 , Yang Liu 3 , Wenceslas Rahajandraibe 4 , Fayu Wan 1 , George Chan 5 , Mathieu Guerin 4
Affiliation
Editor’s notes: This article presents design and test of three-port distributed circuit exhibiting double bandpass (BP) negative group delay (NGD) effect.—Partha Pratim Pande, Washington State University
中文翻译:
全微带三端口电路带通NGD设计与测试
编者注:本文介绍了具有双带通 (BP) 负群延迟 (NGD) 效应的三端口分布式电路的设计和测试。— Partha Pratim Pande,华盛顿州立大学
更新日期:2022-04-01
中文翻译:
全微带三端口电路带通NGD设计与测试
编者注:本文介绍了具有双带通 (BP) 负群延迟 (NGD) 效应的三端口分布式电路的设计和测试。— Partha Pratim Pande,华盛顿州立大学