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A guide to nanoscale IR spectroscopy: resonance enhanced transduction in contact and tapping mode AFM-IR
Chemical Society Reviews ( IF 40.4 ) Pub Date : 2022-05-26 , DOI: 10.1039/d2cs00095d
Jeffrey J Schwartz 1, 2 , Devon S Jakob 2, 3 , Andrea Centrone 2
Affiliation  

Infrared (IR) spectroscopy is a broadly applicable, composition sensitive analytical technique. By leveraging the high spatial resolution of atomic force microscopy (AFM), the photothermal effect, and wavelength-tunable lasers, AFM-IR enables IR spectroscopy and imaging with nanoscale (< 10 nm) resolution. The transduction of a sample's photothermal expansion by an AFM probe tip ensures the proportionality between the AFM-IR signal and the sample absorption coefficient, producing images and spectra that are comparable to far-field IR databases and easily interpreted. This convergence of characteristics has spurred robust research efforts to extend AFM-IR capabilities and, in parallel, has enabled AFM-IR to impact numerous fields. In this tutorial review, we present the latest technical breakthroughs in AFM-IR spectroscopy and imaging and discuss its working principles, distinctive characteristics, and best practices for different AFM-IR measurement paradigms. Central to this review, appealing to both expert practitioners and novices alike, is the meticulous understanding of AFM-IR signal transduction, which is essential to take full advantage of AFM-IR capabilities. Here, we critically compile key information and discuss instructive experiments detailing AFM-IR signal transduction and provide guidelines linking experimental parameters to the measurement sensitivity, lateral resolution, and probed depth. Additionally, we provide in-depth tutorials on the most employed AFM-IR variants (resonance-enhanced and tapping mode AFM-IR), discussing technical details and representative applications. Finally, we briefly review recently developed AFM-IR modalities (peak force tapping IR and surface sensitivity mode) and provide insights on the next exciting opportunities and prospects for this fast-growing and evolving field.

中文翻译:

纳米红外光谱指南:接触和轻敲模式 AFM-IR 中的共振增强转导

红外 (IR) 光谱是一种广泛适用的、对成分敏感的分析技术。通过利用原子力显微镜 (AFM) 的高空间分辨率、光热效应和波长可调激光器,AFM-IR 可实现纳米级 (< 10 nm) 分辨率的红外光谱和成像。AFM 探针尖端对样品光热膨胀的转换确保了 AFM-IR 信号与样品吸收系数之间的比例,从而产生可与远场 IR 数据库相媲美且易于解释的图像和光谱。这种特性的融合激发了强大的研究努力,以扩展 AFM-IR 的能力,同时也使 AFM-IR 能够影响许多领域。在本教程回顾中,我们展示了 AFM-IR 光谱学和成像方面的最新技术突破,并讨论了其工作原理、独特特征和不同 AFM-IR 测量范例的最佳实践。这篇评论的核心是对 AFM-IR 信号转导的细致理解,这对专家从业者和新手都有吸引力,这对于充分利用 AFM-IR 功能至关重要。在这里,我们批判性地编译关键信息并讨论详细说明 AFM-IR 信号转导的指导性实验,并提供将实验参数与测量灵敏度、横向分辨率和探测深度联系起来的指南。此外,我们提供有关最常用的 AFM-IR 变体(共振增强和轻敲模式 AFM-IR)的深入教程,讨论技术细节和代表性应用。最后,
更新日期:2022-05-26
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