Current-voltage (I-V) characteristics of shunted Nb/Al-AlO_x/Nb Josephson junctions (JJs) can be precisely described in the resistive capacitive inductive shunted junction (RCLSJ) model derived from resistive capacitive shunted junction (RCSJ) model with additional parasitic inductance. However, the methods for extraction of current values in the RCLSJ model are not fully developed, which causes unsatisfactor accuracy of the simulations of superconducting integrated circuits. In this work, we propose an innovative method for extraction of parameters that is capable to solve inaccuracy problem. The enhancement is achieved by including the fluctuation of device parameters due to fabrication process in the analysis. A Josephson comparator is designed in the RCLSJ model to test the performance of the proposed parameter extraction method. Obtained results show that our method ensures 2 to 3 times higher simulation accuracy at frequencies above 60 GHz as compared to the traditional method.

分流 Nb/Al-AlO _{x的电流-电压 (IV) 特性}/Nb 约瑟夫森结 (JJs) 可以在电阻电容电感分流结 (RCLSJ) 模型中精确描述，该模型源自具有附加寄生电感的电阻电容分流结 (RCSJ) 模型。然而，在RCLSJ模型中提取电流值的方法还没有得到充分发展，导致超导集成电路模拟的精度不能令人满意。在这项工作中，我们提出了一种创新的参数提取方法，能够解决不准确的问题。通过在分析中包括由于制造过程引起的器件参数波动来实现增强。在 RCLSJ 模型中设计了一个约瑟夫森比较器来测试所提出的参数提取方法的性能。