The increasing demands of multifunctional organic electronics require advanced organic semiconducting materials to be developed and significant improvements to be made to device performance. Thus, it is necessary to gain an in-depth understanding of the film growth process, electronic states, and dynamic structure-property relationship under realistic operation conditions, which can be obtained by in-situ/operando characterization techniques for organic devices. Here, the up-to-date developments in the in-situ/operando optical, scanning probe microscopy, and spectroscopy techniques that are employed for studies of film morphological evolution, crystal structures, semiconductor-electrolyte interface properties, and charge carrier dynamics are described and summarized. These advanced technologies leverage the traditional static characterizations into an in-situ and interactive manipulation of organic semiconducting films and devices without sacrificing the resolution, which facilitates the exploration of the intrinsic structure-property relationship of organic materials and the optimization of organic devices for advanced applications.

中文翻译：

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有机半导体和器件的原位/操作表征技术

多功能有机电子产品日益增长的需求要求开发先进的有机半导体材料并显着提高器件性能。因此，有必要深入了解实际操作条件下的薄膜生长过程、电子状态和动态结构-性能关系，这可以通过有机器件的原位/原位表征技术获得。在这里，描述了用于研究薄膜形态演化、晶体结构、半导体-电解质界面特性和载流子动力学的原位/原位光学、扫描探针显微镜和光谱技术的最新发展并总结。