We present a way to reach the maximum possible critical current density, Jc , for YBa₂Cu₃O 6+x (YBCO) thin films. This value is found to be around ten times the currently reached values. It is found that the Jc (0 T) is governed by the mean free path of the electrons, as is the critical temperature, Tc . The Jc in field, on the other hand, is governed by flux pinning sites and can be enhanced by optimizing the size and distribution of the non-superconducting nanoinclusions. By optimizing both the mean free path and the pinning structure, the maximum values can be reached.

中文翻译：

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电子平均自由程和通量钉扎在优化 YBCO 超导体临界电流中的作用

我们提出了一种达到最大可能临界电流密度的方法， 杰C , 对于 YBa ₂ Cu ₃ O 6个+X (YBCO) 薄膜。发现该值大约是当前达到的值的十倍。结果发现 杰C (0 T) 由电子的平均自由程决定，临界温度也是如此， 吨C . 这 杰C 另一方面，在现场，受通量钉扎点控制，并且可以通过优化非超导纳米夹杂物的尺寸和分布来增强。通过优化平均自由程和钉扎结构，可以达到最大值。