This special issue of IEEE Design&Test is about benchmarking machine learning (ML) applications. A special issue on benchmarking is long overdue. The last one I can find is one I edited way back in 2000. That issue covered the ITC99 benchmarks that I put together and introduced at a special session of the 1999 International Test Conference. These were used for comparing automatic test pattern-generation (ATPG) algorithms.

中文翻译：

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基准测试 基准测试


本期 IEEE Design&Test 特刊是关于机器学习 (ML) 应用程序的基准测试。关于基准测试的特刊早就该出版了。我能找到的最后一本是我在 2000 年编辑的。该期涵盖了我在 1999 年国际测试会议的一次特别会议上整理并介绍的 ITC99 基准。这些用于比较自动测试模式生成 (ATPG) 算法。