当前位置: X-MOL 学术Crop Sci. › 论文详情
Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)
Identification of quantitative trait loci for sorghum leaf blight resistance
Crop Science ( IF 2.0 ) Pub Date : 2022-04-07 , DOI: 10.1002/csc2.20751
Sarah Lipps 1 , William L Rooney 2 , Santiago X. Mideros 1 , Tiffany M. Jamann 1
Affiliation  

Sorghum leaf blight and northern corn leaf blight, both caused by Exserohilum turcicum {(Pass.) K. J. Leonard and Suggs [syn. Setosphaeria turcica (Luttr.) K. J. Leonard and Suggs.]}, are major diseases of sorghum [Sorghum bicolor (L.) Moench] and maize (Zea mays L.), respectively. Examining the genetic architecture of resistance in sorghum will lead to a better understanding of the relationship between resistance in sorghum and maize, which can ultimately enhance management options in both crops. In 2018 and 2019, we evaluated two sorghum recombinant inbred line (RIL) populations for resistance to E. turcicum. The BTx623 × IS3620C and BTx623 × SC155 populations consisted of 235 and 81 RILs, respectively. Resistance in both populations was moderately to highly heritable. We identified a total of six quantitative trait loci (QTL) across the two populations. Three QTL with small- to moderate-effect sizes were identified in the BTx623 × IS3620C population. Three QTL, including a large-effect QTL on chromosome three that explained 24% of the variation, were identified in the BTx623 × SC155 population. We compared the identified QTL with the position of northern corn leaf blight candidate genes and found eight candidate resistance gene orthologs that colocalize with the sorghum leaf blight QTL. There were also several nucleotide-binding leucine-rich repeat encoding genes within the candidate intervals. Understanding host resistance in multiple species furthers our understanding of the Exserohilum turcicum patho-system.

中文翻译:

高粱叶枯病抗性数量性状位点的鉴定

高粱叶枯病和北方玉米叶枯病,都是由Exserohilum turcicum {(Pass.) KJ Leonard 和 Suggs [同义词。Setosphaeria turcica (Luttr.) KJ Leonard 和 Suggs.]},分别是高粱 [ Sorghum bicolor (L.) Moench] 和玉米 ( Zea mays L.)的主要病害。检查高粱抗性的遗传结构将有助于更好地了解高粱和玉米抗性之间的关系,从而最终增强两种作物的管理选择。在 2018 年和 2019 年,我们评估了两个高粱重组自交系 (RIL) 群体对E. turcicum的抗性. BTx623 × IS3620C 和 BTx623 × SC155 种群分别由 235 和 81 个 RIL 组成。两个人群的抗性都是中度到高度遗传的。我们在两个群体中确定了总共六个数量性状基因座 (QTL)。在 BTx623 × IS3620C 群体中确定了三个具有中小效应大小的 QTL。在 BTx623 × SC155 群体中鉴定了三个 QTL,包括解释 24% 变异的染色体三上的大效应 QTL。我们将鉴定的QTL与北方玉米叶枯病候选基因的位置进行了比较,发现了8个与高粱叶枯病QTL共定位的候选抗性基因直系同源物。在候选区间内还有几个核苷酸结合的富含亮氨酸的重复编码基因。Exserohilum turcicum病理系统。
更新日期:2022-04-07
down
wechat
bug