当前位置: X-MOL 学术IEEE Des. Test › 论文详情
Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)
Special Issue on Near-Memory and In-Memory Processing
IEEE Design & Test ( IF 1.9 ) Pub Date : 2022-02-28 , DOI: 10.1109/mdat.2022.3147071
Partha Pratim Pande 1
Affiliation  

The articles in this issue are divided into three groups: 1) the first group belongs to a special issue (SI) covering selected articles from the 33rd Symposium on Integrated Circuits and Systems Design (SBCCI 2020); 2) SI on Near-Memory and In-Memory Processing; and 3) general interest articles.

中文翻译:


近内存和内存处理特刊



本期文章分为三组:1)第一组属于特刊(SI),涵盖第33届集成电路与系统设计研讨会(SBCCI 2020)的精选文章; 2)关于近内存和内存处理的SI; 3)一般兴趣文章。
更新日期:2022-02-28
down
wechat
bug