当前位置：
X-MOL 学术
›
Adv. Funct. Mater.
›
论文详情
Our official English website, www.x-mol.net, welcomes your
feedback! (Note: you will need to create a separate account there.)
Imaging Dielectric Breakdown in Valence Change Memory (Adv. Funct. Mater. 2/2022)
Advanced Functional Materials ( IF 18.5 ) Pub Date : 2022-01-12 , DOI: 10.1002/adfm.202270012 William A. Hubbard 1, 2 , Jared J. Lodico 1, 2 , Ho Leung Chan 1, 2 , Matthew Mecklenburg 3 , Brian C. Regan 1, 2
Advanced Functional Materials ( IF 18.5 ) Pub Date : 2022-01-12 , DOI: 10.1002/adfm.202270012 William A. Hubbard 1, 2 , Jared J. Lodico 1, 2 , Ho Leung Chan 1, 2 , Matthew Mecklenburg 3 , Brian C. Regan 1, 2
Affiliation
|
Dielectric Breakdown
中文翻译：
化合价变化存储器中的成像介电击穿（Adv. Funct. Mater. 2/2022）
介电击穿
更新日期：2022-01-12
中文翻译：
化合价变化存储器中的成像介电击穿（Adv. Funct. Mater. 2/2022）
介电击穿
京公网安备 11010802027423号