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Imaging Dielectric Breakdown in Valence Change Memory (Adv. Funct. Mater. 2/2022)
Advanced Functional Materials ( IF 18.5 ) Pub Date : 2022-01-12 , DOI: 10.1002/adfm.202270012
William A. Hubbard 1, 2 , Jared J. Lodico 1, 2 , Ho Leung Chan 1, 2 , Matthew Mecklenburg 3 , Brian C. Regan 1, 2
Affiliation  

Dielectric Breakdown

中文翻译:

化合价变化存储器中的成像介电击穿(Adv. Funct. Mater. 2/2022)

介电击穿
更新日期:2022-01-12
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