Soybean sudden death syndrome (SDS) is a disease caused by a soil-borne fungus, Fusarium virguliforme. Many genetic studies have attempted to identify genes responsible for the quantitative host resistance to SDS. Three recombinant inbred line (RIL) populations were evaluated for foliar SDS resistance at a naturally infested field site in Decatur, MI, during the 2014 and 2015 growing seasons. Lines were evaluated for disease severity (DS) on a 1–9 scale, disease incidence (DI) as an estimate of the percentage of plants with symptoms per plot, and disease index (DX) as a metric which integrates DS and DI. Phenotypic data was spatially adjusted to account for uneven pathogen distribution in the naturally infested field. A subset of RILs from each population were genotyped with the SoySNP6K Illumina Infinium BeadChip. Linkage maps unique to each population were constructed using JoinMap ver. 2. Composite interval mapping was performed using WinQTLCartographer ver. 2.5. Three quantitative trait loci (QTL) were identified across 2 yr and/or multiple populations. One QTL on Chromosome 10 appeared to be colocalized with the E2 maturity locus. Another QTL identified was on Chromosome 18, in a region which has been demonstrated to provide soybean cyst nematode (SCN) and SDS resistance in many studies (rhg1/Rfs2).

中文翻译：

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宿主对大豆猝死综合征的抗性遗传作图

大豆猝死综合征 (SDS) 是一种由土壤传播的真菌Fusarium v​​irguliforme引起的疾病. 许多遗传学研究试图确定负责定量宿主对 SDS 抗性的基因。在 2014 年和 2015 年生长季节期间，在密歇根州迪凯特的一个自然侵染的田间，对三个重组近交系 (RIL) 种群的叶面 SDS 抗性进行了评估。以 1-9 的尺度评估品系的疾病严重程度 (DS)，疾病发生率 (DI) 作为每块地块出现症状的植物百分比的估计值，以及疾病指数 (DX) 作为整合 DS 和 DI 的指标。表型数据在空间上进行了调整，以说明自然侵染区域中病原体分布不均匀。使用 SoySNP6K Illumina Infinium BeadChip 对来自每个群体的 RIL 子集进行基因分型。每个种群独有的连锁图是使用 JoinMap ver 构建的。2. 使用 WinQTLCartographer 版本执行复合区间映射。2.5. 在 2 年和/或多个群体中鉴定了三个数量性状基因座 (QTL)。10 号染色体上的一个 QTL 似乎与E2成熟度轨迹。另一个确定的 QTL 在 18 号染色体上，该区域在许多研究中已被证明可提供大豆胞囊线虫 (SCN) 和 SDS 抗性 (rhg1/Rfs2)。