The arrival of direct electron detectors (DEDs) with high frame rates in the field of scanning transmission electron microscopy (TEM) has enabled many experimental techniques that require collection of a full diffraction pattern at each scan position, a field which is subsumed under the name four-dimensional scanning transmission electron microscopy ( 4D-STEM ). DED frame rates approaching 100 kHz require data transmission rates and data storage capabilities that exceed those of the commonly available computing infrastructures. Current commercial DEDs allow the user to make compromises in pixel bit depth, detector binning, or windowing to reduce the per-frame file size and allow higher frame rates. This change in detector specifications requires decisions to be made before data acquisition that may reduce or lose information that could have been advantageous during data analysis.

中文翻译：

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来自电子事件表示数据的实时交互式 4D-STEM 相位对比成像：使用正确表示减少计算

扫描透射电子显微镜 (TEM) 领域中具有高帧速率的直接电子探测器 (DED) 的出现使许多实验技术成为可能，这些技术需要在每个扫描位置收集完整的衍射图案，该领域被归入名称四维扫描透射电子显微镜（ 4D 茎）。接近 100 kHz 的 DED 帧速率需要超过常用计算基础设施的数据传输速率和数据存储能力。当前的商业 DED 允许用户在像素位深度、检测器合并或窗口化方面做出妥协，以减少每帧文件的大小并允许更高的帧速率。检测器规格的这种变化需要在数据采集之前做出决定，这可能会减少或丢失在数据分析过程中可能有利的信息。