Transmission electron microscopy (TEM) is a powerful tool for imaging material structure and characterizing material chemistry. Recent advances in data collection technology for TEM have enabled high-volume and high-resolution data collection at a microsecond frame rate. Taking advantage of these advances in data collection rates requires the development and application of data processing tools, including image analysis, feature extraction, and streaming data processing techniques. In this article, we highlight a few areas in materials science that have benefited from combining signal processing and statistical analysis with data collection capabilities in TEM and present a future outlook on opportunities of integrating signal processing with automated TEM data analysis.

中文翻译：

---

原位透射电子显微镜：信号处理挑战和示例


透射电子显微镜 (TEM) 是对材料结构进行成像和表征材料化学的强大工具。 TEM 数据采集技术的最新进展使得能够以微秒帧速率采集大量、高分辨率的数据。利用数据收集率的这些进步需要开发和应用数据处理工具，包括图像分析、特征提取和流数据处理技术。在本文中，我们重点介绍了材料科学中受益于将信号处理和统计分析与 TEM 数据收集功能相结合的几个领域，并对将信号处理与自动化 TEM 数据分析集成的机会提出了未来展望。