Abstract

In order to debug projects of digital microelectronic systems, it is necessary to form a certain set of test influences on the simulated system in order to check the correctness of its functioning. A large number of digital systems are characterized by a sequence of functions from a finite alphabet. In this paper, a partial semigroup is defined on the set of admissible sequences of functions. The admissible sequences are formalized by introducing a graph of functions that specifies the possible functions for execution for various states of the digital system. The graph of functions together with the sets of input interactions for each function define the specification of the external behavior of the digital system. It is established that if the admissibility of the sequential execution of two functions depends on the previously performed functions and the state of the digital system, then some functions should be divided into subfunctions. It is shown that the set of debugging tests should include both checking the execution of sequences of functions and the correctness of the execution of each function with different sets of parameters.

中文翻译：

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基于检查所需功能性能的数字微电子系统设计中调试测试的选择形式化

摘要

为了调试数字微电子系统的项目，需要对模拟系统形成一定的测试影响集，以检查其功能的正确性。大量数字系统的特征在于来自有限字母表的一系列函数。在本文中，一个部分半群被定义在一组可允许的函数序列上。通过引入功能图来形式化允许的序列，该图指定了针对数字系统的各种状态执行的可能功能。函数图以及每个函数的输入交互集定义了数字系统的外部行为规范。已经确定，如果两个功能的顺序执行的可接受性取决于先前执行的功能和数字系统的状态，那么某些功能应划分为子功能。结果表明，调试测试集应该包括检查函数序列的执行和每个函数在不同参数集下执行的正确性。