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Application of atomic force microscopy to the study of low-temperature strain of elastomeric materials
Plastics, Rubber and Composites ( IF 2.1 ) Pub Date : 2021-11-25 , DOI: 10.1080/14658011.2021.2008704
Nikolay Victorovich Shadrinov 1 , Andrey Leonidovich Fedorov 1
Affiliation  

ABSTRACT

The present paper demonstrates the possibility of the use of atomic force microscopy (AFM) to study the morphology of elastomeric materials under stretching. A prototype of a stretching device that could be integrated into AFM for the tensile drawing of polymer at different temperatures including low temperature was constructed. As a trial sample for testing the prototype of low temperature stretching device nitrile butadiene rubber (NBR) was selected. The strain-induced morphological changes of neat NBR and NBR with plasticiser were studied. Poisson's ratio and average surface microroughness at different temperatures and strains are measured.



中文翻译:

原子力显微镜在弹性材料低温应变研究中的应用

摘要

本论文展示了使用原子力显微镜 (AFM) 研究弹性材料在拉伸下的形态的可能性。构建了一个可以集成到 AFM 中的拉伸装置原型,用于在包括低温在内的不同温度下拉伸聚合物。选择低温拉伸装置丁腈橡胶(NBR)作为试验样品。研究了纯丁腈橡胶和含增塑剂丁腈橡胶的应变诱导形态变化。测量了不同温度和应变下的泊松比和平均表面微粗糙度。

更新日期:2021-11-25
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