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Reliability of one-shot device with generalized gamma lifetime under cyclic accelerated life-test
Proceedings of the Institution of Mechanical Engineers, Part O: Journal of Risk and Reliability ( IF 1.7 ) Pub Date : 2021-11-23 , DOI: 10.1177/1748006x211058938
Xiaojun Zhu 1 , Kai Liu 2
Affiliation  

One-shot devices are products or equipments that can be used only once. A nature characteristic of one-shot devices is that they get destroyed immediately after their use, and therefore their actual lifetimes are never observable. The only information observed is the condition whether they worked or not at the time they are used. These days the quality of products are significantly improved, so that the information obtained under a normal test during a short time is quite limited. A typical test to induce more failures is the accelerated life-test, which is developed by increasing the stress levels under test. In this paper, we will investigate the reliability of one-shot devices with generalized gamma fatigue life under accelerated life-tests with various cyclic temperature fluctuations by assuming a Norris-Landzberg model. Generalized gamma involves many common lifetime distributions, such as gamma, Weibull, lognormal, and positive stable distributions, as special cases. Norris-Landzberg model takes not only temperature change, highest testing temperature, but also the cycling frequency into account when modeling the number of cycles-to-failure, resulting a generalized model with the well-known Coffin-Manson model and Coffin-Manson-Arrhenius model as special cases. Associated inferences are developed. The performance of the proposed model and inferential methods will be evaluated with simulation study and model discrimination. Finally, the chip-scale package solder joints data is analyzed to illustrate the considered model and inferential methods developed in this paper.



中文翻译:

循环加速寿命试验下具有广义伽马寿命的一次性装置的可靠性

一次性设备是只能使用一次的产品或设备。一次性设备的一个自然特征是它们在使用后立即被破坏,因此它们的实际寿命永远无法观察到。观察到的唯一信息是它们在使用时是否有效。如今,产品质量显着提高,因此在短时间内通过正常测试获得的信息非常有限。导致更多故障的典型测试是加速寿命测试,它是通过增加测试中的应力水平而开发的。在本文中,我们将通过假设 Norris-Landzberg 模型,研究在具有各种循环温度波动的加速寿命测试下具有广义伽马疲劳寿命的一次性装置的可靠性。广义 gamma 涉及许多常见的生命周期分布,例如 gamma、Weibull、对数正态分布和作为特殊情况的正稳定分布。Norris-Landzberg 模型在对失效循环次数进行建模时不仅考虑了温度变化、最高测试温度,而且还考虑了循环频率,从而产生了具有众所周知的 Coffin-Manson 模型和 Coffin-Manson 的广义模型- Arrhenius 模型作为特例。相关推论得到发展。所提出的模型和推理方法的性能将通过模拟研究和模型判别进行评估。最后,对芯片级封装焊点数据进行了分析,以说明本文开发的所考虑的模型和推理方法。和正稳定分布,作为特殊情况。Norris-Landzberg 模型在对失效循环次数进行建模时不仅考虑了温度变化、最高测试温度,而且还考虑了循环频率,从而产生了具有众所周知的 Coffin-Manson 模型和 Coffin-Manson 的广义模型- Arrhenius 模型作为特例。相关推论得到发展。所提出的模型和推理方法的性能将通过模拟研究和模型判别进行评估。最后,对芯片级封装焊点数据进行了分析,以说明本文开发的所考虑的模型和推理方法。和正稳定分布,作为特殊情况。Norris-Landzberg 模型在对失效循环次数进行建模时不仅考虑了温度变化、最高测试温度,而且还考虑了循环频率,从而产生了具有众所周知的 Coffin-Manson 模型和 Coffin-Manson 的广义模型- Arrhenius 模型作为特例。相关推论得到发展。所提出的模型和推理方法的性能将通过模拟研究和模型判别进行评估。最后,对芯片级封装焊点数据进行了分析,以说明本文开发的所考虑的模型和推理方法。但在对循环失败次数进行建模时也考虑了循环频率,从而产生了一个以众所周知的 Coffin-Manson 模型和 Coffin-Manson-Arrhenius 模型作为特例的广义模型。相关推论得到发展。所提出的模型和推理方法的性能将通过模拟研究和模型判别进行评估。最后,对芯片级封装焊点数据进行了分析,以说明本文开发的所考虑的模型和推理方法。但在对循环失败次数进行建模时也考虑了循环频率,从而产生了一个以众所周知的 Coffin-Manson 模型和 Coffin-Manson-Arrhenius 模型作为特例的广义模型。相关推论得到发展。所提出的模型和推理方法的性能将通过模拟研究和模型判别进行评估。最后,对芯片级封装焊点数据进行了分析,以说明本文开发的所考虑的模型和推理方法。

更新日期:2021-11-23
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