A state-of-the-art compact Low-Energy X-ray Reflectometer is in operation at DTU Space and is used to characterize x-ray coatings for the optics of future spaceborne and ground-based telescopes. The reflectometer is housed in a vacuum chamber and operates at 1.487 keV, complimenting an existing 8.048 keV reflectometer. With a microfocus source and plane-parabolic Kirkpatrick–Baez mirrors, the 0.5-mm wide beam is collimated to <0.75 arcmin. An actively cooled 2D CCD yields sample alignment precision of 26 μm in linear position and 0.18 arcmin in angle. A multilayer monochromator provides a peak reflectance of 43.5% and beam purity > 99 % . The reflectometer has a 2θ range of 0 deg to 35 deg and dynamic range up to eight orders of magnitude. Techniques are demonstrated to investigate the sample surface morphology and we show the system’s capability to detect the presence of atmospheric contaminants on coated mirrors.

中文翻译：

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DTU 空间低能 X 射线反射仪的设计、性能和利用

最先进的紧凑型低能量 X 射线反射计在 DTU 空间运行，用于表征未来星载和地面望远镜光学元件的 X 射线涂层。反射计安装在真空室中，工作电压为 1.487 keV，与现有的 8.048 keV 反射计相得益彰。使用微焦点源和平面抛物面 Kirkpatrick-Baez 反射镜，0.5 毫米宽的光束准直至 <0.75 弧分。主动冷却的 2D CCD 在线性位置产生 26 μm 的样品对准精度和 0.18 arcmin 的角度。多层单色器的峰值反射率为 43.5%，光束纯度 > 99%。反射计具有 0 度到 35 度的 2θ 范围和高达 8 个数量级的动态范围。