Dispersion engineering and measurement are significant for nonlinear photonic applications using whispering gallery mode microresonators. Specifically, the Kerr microresonator frequency comb as an important example has attracted a great amount of interest in research fields due to the potential capability of full integration on a chip. A simple and cost-efficient way for dispersion measurements is thereby in high demand for designing such a microcomb device. Here, we report a dispersion measurement approach using a fiber ring etalon reference. The free spectral range of the etalon is first measured through sideband modulation, and the dispersion of the etalon is inferred by binary function fitting during the dispersion measurement. This method is demonstrated on two ${\mathrm{MgF}}_2$ disk resonators. Experimental results show good agreement with numerical simulations using the finite element method. Dispersion engineering on such resonators is also numerically investigated.

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使用光纤环标准具在晶体微谐振器中的色散工程和测量

色散工程和测量对于使用回音壁模式微谐振器的非线性光子应用具有重要意义。具体来说，克尔微谐振器频率梳作为一个重要的例子，由于具有完全集成在芯片上的潜在能力，引起了研究领域的极大兴趣。因此，对于设计这样的微梳装置非常需要一种用于色散测量的简单且具有成本效益的方法。在这里，我们报告了一种使用光纤环标准具参考的色散测量方法。首先通过边带调制测量标准具的自由光谱范围，在色散测量过程中通过二元函数拟合推断标准具的色散。该方法在两个${\mathrm{氟化镁}}_2$盘式谐振器。实验结果表明与使用有限元方法的数值模拟非常吻合。还对此类谐振器的色散工程进行了数值研究。