Spectra of the optical constants n and k of a substance are often deduced from spectroscopic measurements, performed on a thick and homogeneous sample, and from a model used to simulate these measurements. Spectra obtained for n and k using the ellipsometric method generally produce polarized reflectance simulations in strong agreement with the experimental measurements, but they sometimes introduce significant discrepancies over limited spectral ranges, whereas spectra of n and k obtained with the single-angle reflectance method require a perfectly smooth sample surface to be viable. This paper presents an alternative method to calculate n and k. The method exploits both ellipsometric measurements and s-polarized specular reflectance measurements, and compensates for potential surface scattering effects with the introduction of a specularity factor. It is applicable to bulk samples having either a smooth or a rough surface. It provides spectral optical constants that are consistent with s-polarized reflectance measurements. Demonstrations are performed in the infrared region using a glass slide (smooth surface) and a pellet of compressed ammonium sulfate powder (rough surface).

物质的光学常数n和k的光谱通常从光谱测量中推导出来，在厚且均匀的样品上进行，以及从用于模拟这些测量的模型中推导出来。使用椭偏法获得的n和k 的光谱通常产生与实验测量结果非常一致的偏振反射模拟，但它们有时会在有限的光谱范围内引入显着差异，而使用单角反射法获得的n和k 的光谱需要一个完美光滑的样品表面是可行的。本文提出了一种计算n和ķ。该方法利用椭偏测量和s偏振镜面反射测量，并通过引入镜面反射系数来补偿潜在的表面散射效应。它适用于具有光滑或粗糙表面的大块样品。它提供与s偏振反射测量一致的光谱光学常数。使用载玻片（光滑表面）和压缩硫酸铵粉末颗粒（粗糙表面）在红外区域进行演示。