The use of high-energy synchrotron X-ray diffraction sources has become increasingly common for high-quality phase fraction measurements and microstructural evolution experiments. While the high flux, large volume illuminated and large number of diffraction vectors should reduce common sources of uncertainty and bias, the distribution of the diffraction vectors may still cause bias in the phase fraction measurement. This hypothesis of bias was investigated with example experimental data and synthetic data. The authors found that there may be bias depending on the sample texture, the distribution of diffraction vectors and the hkl planes used in the phase fraction measurement, even for nearly complete coverage of a pole figure. The authors developed a series of geometry-based correction values that reduced the measurement bias due to sampling scheme and texture in the phase fraction measurement by an order of magnitude. The efficacy of these corrections was demonstrated with application to both experimental and synthetic data.

中文翻译：

---

从透射衍射数据确定织构合金的相分数的细化

高能同步加速器 X 射线衍射源的使用在高质量相分数测量和微观结构演化实验中变得越来越普遍。虽然高通量、大体积照明和大量衍射矢量应该减少不确定性和偏差的常见来源，但衍射矢量的分布仍可能导致相位分数测量中的偏差。使用示例实验数据和合成数据研究了这种偏差假设。作者发现根据样本纹理、衍射矢量的分布和hkl可能存在偏差用于相位分数测量的平面，甚至几乎完全覆盖极图。作者开发了一系列基于几何的校正值，将相位分数测量中由于采样方案和纹理造成的测量偏差降低了一个数量级。这些修正的有效性通过对实验和合成数据的应用得到了证明。