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Microscopic origin of the high thermoelectric figure of merit ofn-doped SnSe
Physical Review B ( IF 3.2 ) Pub Date : 2021-09-24 , DOI: 10.1103/physrevb.104.115204
Anderson S. Chaves 1 , Daniel T. Larson 2 , Efthimios Kaxiras 2, 3 , Alex Antonelli 4
Affiliation  

Excellent thermoelectric performance in the out-of-layer n-doped SnSe has been observed experimentally [Chang et al., Science 360, 778 (2018)]. However, a first-principles investigation of the dominant scattering mechanisms governing all thermoelectric transport properties is lacking. In the present paper, by applying extensive first-principles calculations of electron-phonon coupling associated with parameterized calculation of the scattering by ionized impurities, we investigate the reasons behind the superior figure of merit as well as the enhancement of zT above 600 K in n-doped out-of-layer SnSe, as compared to p-doped SnSe with similar carrier densities. For the n-doped case, the relaxation time is dominated by ionized impurity scattering and increases with temperature, a feature that maintains the power factor at high values at higher temperatures and simultaneously causes the carrier thermal conductivity at zero electric current (κel) to decrease faster for higher temperatures, leading to an ultrahigh-zT=3.1 at 807 K. We rationalize the roles played by κel and κ0 (the thermal conductivity due to carrier transport under isoelectrochemical conditions) in the determination of zT. Our results show the ratio between κ0 and the lattice thermal conductivity indeed corresponds to the upper limit for zT, whereas the difference between calculated zT and the upper limit is proportional to κel.

中文翻译:

n掺杂SnSe的高热电品质因数的微观起源

层外具有优异的热电性能 n已通过实验观察到掺杂的 SnSe [Chang等人。,科学 360 , 778 (2018)]。然而,缺乏对控制所有热电传输特性的主要散射机制的第一性原理研究。在本文中,通过应用与电离杂质散射的参数化计算相关的电子-声子耦合的广泛第一性原理计算,我们研究了优异品质因数以及增强z 600 K 以上 n- 掺杂的层外 SnSe,与 掺杂的 SnSe 具有相似的载流子密度。为了n-掺杂情况下,弛豫时间由电离杂质散射控制并随温度增加,这一特性在较高温度下将功率因数保持在高值,同时在零电流下引起载流子热导率 (κ埃尔) 在较高温度下下降得更快,导致超高z=3.1 在 807 K. 我们将所扮演的角色合理化 κ埃尔κ0 (等电化学条件下载流子传输引起的热导率)在测定 z. 我们的结果显示了κ0 并且晶格热导率确实对应于上限 z,而计算之间的差异 z 和上限成正比 κ埃尔.
更新日期:2021-09-24
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