Electrochemistry of Thin Films with In Situ/Operando Grazing Incidence X-Ray Scattering: Bypassing Electrolyte Scattering for High Fidelity Time Resolved Studies,Small

当前位置： X-MOL 学术 › Small › 论文详情

Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)

Electrochemistry of Thin Films with In Situ/Operando Grazing Incidence X-Ray Scattering: Bypassing Electrolyte Scattering for High Fidelity Time Resolved Studies
Small ( IF 13.0 ) Pub Date : 2021-09-21 , DOI: 10.1002/smll.202103213
Bryan D Paulsen ₁ , Alexander Giovannitti ₂ , Ruiheng Wu ₃ , Joseph Strzalka ₄ , Qingteng Zhang ₄ , Jonathan Rivnay _{1,

5} , Christopher J Takacs ₆

Affiliation

Electroactive polymer thin films undergo repeated reversible structural change during operation in electrochemical applications. While synchrotron X-ray scattering is powerful for the characterization of stand-alone and ex situ organic thin films, in situ/operando structural characterization has been underutilized—in large part due to complications arising from supporting electrolyte scattering. This has greatly hampered the development of application relevant structure property relationships. Therefore, a new methodology for in situ/operando X-ray characterization that separates the incident and scattered X-ray beam path from the electrolyte is developed. As a proof of concept, the operando structural characterization of weakly-scattering, organic mixed conducting thin films in an aqueous electrolyte environment is demonstrated, accessing previously unexplored changes in the π-π peak and diffuse scatter, while capturing the solvent swollen thin film structure which is inaccessible in previous ex situ studies. These in situ/operando measurements improve the sensitivity to structural changes, capturing minute changes not possible ex situ, and have multimodal potential such as combined Raman measurements that also serve to validate the true in situ/operando conditions of the cell. Finally, new directions enabled by this in situ/operando cell design are examined and state of the art measurements are compared.

中文翻译：

具有原位/操作数掠入射 X 射线散射的薄膜电化学：绕过电解质散射进行高保真时间分辨研究

电活性聚合物薄膜在电化学应用中的操作过程中会经历重复的可逆结构变化。虽然同步加速器 X 射线散射对于表征独立和非原位有机薄膜非常有效，但原位/操作结构表征并未得到充分利用——这在很大程度上是由于支持电解质散射引起的并发症。这极大地阻碍了应用相关结构属性关系的发展。因此，开发了一种新的原位/操作 X 射线表征方法，将入射和散射的 X 射线束路径与电解质分开。作为概念证明，演示了水性电解质环境中弱散射有机混合导电薄膜的操作结构特征，访问以前未探索的 π-π 峰和漫散射的变化，同时捕获在以前的非原位研究中无法访问的溶剂溶胀薄膜结构。这些原位/操作测量提高了对结构变化的敏感性，捕获了非原位不可能的微小变化，并具有多模式潜力，例如组合拉曼测量，也可用于验证细胞的真实原位/操作条件。最后，检查了这种原位/操作单元设计所带来的新方向，并比较了最先进的测量方法。捕获在异地不可能发生的微小变化，并具有多模式潜力，例如组合拉曼测量，也可用于验证细胞的真实原位/操作条件。最后，检查了这种原位/操作单元设计所带来的新方向，并比较了最先进的测量方法。捕获在异地不可能发生的微小变化，并具有多模式潜力，例如组合拉曼测量，也可用于验证细胞的真实原位/操作条件。最后，检查了这种原位/操作单元设计带来的新方向，并比较了现有技术的测量结果。

更新日期：2021-10-21

点击分享查看原文

点击收藏

阅读更多本刊最新论文本刊介绍/投稿指南11