Abstract

In this paper, we show that it is possible to use an ac grid to obtain high-magnitude electrical current pulses used in testing power semiconductor devices. Disadvantages of current capacitor-based test setups are noted. A design solution for partitioning the transformer secondary winding by splitting its multiwire execution into separate bundles is proposed.

中文翻译：

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使用交流电网产生用于测试功率半导体器件的冲击电流脉冲的可能性

摘要

在本文中，我们表明可以使用交流电网获得用于测试功率半导体器件的高幅度电流脉冲。注意到当前基于电容器的测试设置的缺点。提出了一种设计解决方案，用于通过将多线执行拆分为单独的束来划分变压器次级绕组。