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Conceptual Design of an Electrostatic Trap for High-Intensity Highly Charged Pulsed Beam
IEEE Transactions on Plasma Science ( IF 1.3 ) Pub Date : 2021-08-17 , DOI: 10.1109/tps.2021.3102986
Wei Huang , Yuguo Liu , Liangting Sun

Highly charged ion sources play an important role in the advancement of heavy-ion accelerators worldwide. Demands of highly charged heavy ions for new and existing accelerators have driven the performance of ion sources to their limits. A new high charge state ion accumulating trap concept is proposed that converts a dc ion beam from an electron cyclotron resonance (ECR) ion source into a short-pulsed ion beam with suitable compression ratios. With a simple trap composed of an electron gun, a solenoid, and a set of drift tubes (DTs), the injected ions from a dc operation ECR ion source will be trapped radially and axially. By manipulating the potential of the DT, highly charged ions can be accumulated with multiple injections and extracted with augmentation of ion intensity in pulses of tens of μs\mu \text{s} . This article presents the simulations and design features of the envisioned ion trap.

中文翻译:


高强度高带电脉冲束静电阱的概念设计



高电荷离子源在全球重离子加速器的发展中发挥着重要作用。新的和现有的加速器对高电荷重离子的需求已经将离子源的性能推向极限。提出了一种新的高电荷态离子累积陷阱概念,它将来自电子回旋共振(ECR)离子源的直流离子束转换为具有合适压缩比的短脉冲离子束。通过由电子枪、螺线管和一组漂移管 (DT) 组成的简单陷阱,来自直流操作 ECR 离子源的注入离子将被径向和轴向捕获。通过操纵 DT 的电位,可以通过多次注射来积累高电荷离子,并通过增强数十 μs\mu \text{s} 脉冲中的离子强度来提取。本文介绍了设想的离子阱的模拟和设计特征。
更新日期:2021-08-17
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