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Impact of boron doping on electrical performance and efficiency of n-TOPCon solar cell
Solar Energy ( IF 6.0 ) Pub Date : 2021-09-14 , DOI: 10.1016/j.solener.2021.08.075
Qinqin Wang 1, 2 , Wangping Wu 3 , Yunpeng Li 1, 2 , Ling Yuan 4 , Sanchuan Yang 4 , Yufeng Sun 4 , Songbo Yang 4 , Qiang Zhang 4 , Yujia Cao 4 , Hui Qu 4 , Ningyi Yuan 1, 2 , Jianning Ding 2, 5
Affiliation  

A big challenge to improve the conversion efficiency of n-type solar cell is the recombination and electrical contacting of boron (B)-doped emitters in n-TOPCon solar cells. This work investigates the emitter dark saturation current density under the passivation layer (J0e, passivated), the metallization-induced recombination current density under the metal contact (J0e, metal), and the IV parameters, including short-circuit current density (Jsc), open circuit voltage (Voc), fill factor (FF) and efficiency (Eff) as functions of the peak concentration (Nmax) and junction depth of B-doped profile. We introduced the profile with the peak concentration of 1–1.5 × 1019 atoms/cm3 and a junction depth of 0.75–1.0 μm to improve the conversion efficiency of 23.4%. The results revealed that Jsc, implied Voc (iVoc) and the contact resistance (ρc) were negative correlated with the Nmax and junction depth. However, J0e, passivated had a positive correlation with the same. The results from ρc, J0e along with the IV showed the junction depth of emitter doping profiles need to exceed the corroded depth of Ag/Al paste to get a low ρc, meanwhile, a low J0e should be ensured. The results suggested theB-selective emitters were developed with a low ρc and a low J0e. After optimizing B-selective emitters and passivation processes, we obtained industry-grade TOPCon cells with Eff, Voc, Jsc, and FF as high as 23.7%, 709 mV, 40.8 mA/cm2, and 82%, respectively. This optimized B-doped and simplified B-selective emitters processes can be commercially applied in photovoltaics.



中文翻译:

硼掺杂对n-TOPCon太阳能电池电性能和效率的影响

提高 n 型太阳能电池转换效率的一大挑战是 n-TOPCon 太阳能电池中掺硼 (B) 发射极的复合和电接触。这项工作研究了钝化层下的发射极暗饱和电流密度(J 0e,钝化),金属接触下的金属化诱导复合电流密度(J 0e,金属),以及IV参数,包括短路电流密度 ( J sc )、开路电压 ( V oc )、填充因子 (FF) 和效率 ( E ff ) 作为峰值浓度 ( N max ) 的函数) 和 B 掺杂剖面的结深度。我们引入了峰值浓度为 1–1.5 × 10 19原子/cm 3和结深为 0.75–1.0 μm的轮廓,以提高 23.4% 的转换效率。结果表明,J sc、隐含V oc (i V oc ) 和接触电阻( ρ c ) 与N max和结深度呈负相关。然而,J 0e,钝化与相同具有正相关。从结果ρ ÇĴ 0E与沿-V表明发射极掺杂分布的结深度需要超过 Ag/Al 膏的腐蚀深度才能获得低ρ c,同时应确保低J 0e。结果表明,B 选择性发射器是用低ρ c和低J 0e 开发的。在优化B-selective发射器和钝化工艺后,我们获得了E ffV ocJ sc和FF 高达23.7%、709 mV、40.8 mA/cm 2 的工业级TOPCon电池和 82%,分别为。这种优化的 B 掺杂和简化的 B 选择性发射器工艺可以商业应用在光伏领域。

更新日期:2021-09-15
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