A new model of photovoltaic (PV) panel is proposed. The model precisely replicates sub-cell level degradation, such as cracks and interconnect failures, and reproduces their effect at the panel level I–V characteristic. Moreover, a regression method is proposed, which infers the model’s parameters from combination of electroluminescent (EL) image and degraded I–V characteristic. The combination of quantitative (EL image) and qualitative (I–V characteristic) enables to characterize the degradation of the cells embedded in the PV panel, without physical access to the cells. The proposed model and the regression problem is experimentally verified on a set of 3 single cell measurements and a set of 4 crystalline PV panels with various levels of degradation.

提出了一种新型光伏（PV）面板。该模型精确地复制了子电池级退化，例如裂纹和互连故障，并在面板级 I-V 特性上再现了它们的影响。此外，还提出了一种回归方法，该方法从电致发光 (EL) 图像和退化的 I-V 特性的组合中推断模型的参数。定量（EL 图像）和定性（I-V 特性）的组合能够表征嵌入 PV 面板中的电池的退化，而无需物理接触电池。所提出的模型和回归问题在一组 3 个单电池测量值和一组 4 个具有不同退化水平的晶体 PV 面板上进行了实验验证。