Further characterization of SA01 and SA02 zircon reference materials for Si and Zr isotopic compositions via femtosecond laser ablation MC-ICP-MS,Journal of Analytical Atomic Spectrometry

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Further characterization of SA01 and SA02 zircon reference materials for Si and Zr isotopic compositions via femtosecond laser ablation MC-ICP-MS
Journal of Analytical Atomic Spectrometry ( IF 3.1 ) Pub Date : 2021-08-17 , DOI: 10.1039/d1ja00160d
Chao Huang _{1,

2} , Hao Wang _{1,

2} , Hui-Min Yu ₃ , Lan-Ping Feng ₄ , Lie-Wen Xie _{1,

2} , Yue-Heng Yang _{1,

2} , Shi-Tou Wu _{1,

2} , Lei Xu _{1,

2} , Jin-Hui Yang _{1,

2}

Affiliation

Here we present Si and Zr isotopic data of SA01 and SA02 zircons via multi-technique analytical methods to evaluate the suitability of the two zircon reference materials for in situ Si and Zr isotopic analysis using femtosecond laser ablation multi-collector inductively coupled plasma mass spectrometry (fs-LA-MC-ICP-MS). Precise and accurate Si and Zr isotopic compositions were determined by solution nebulization (SN) MC-ICP-MS. Fifteen SN-MC-ICP-MS Si isotopic measurements on two aliquots of SA01 zircon solutions gave consistent results with an average δ³⁰Si (relative to NBS28) value of −0.29 ± 0.08‰ (2SD), whereas a slight inter-grain offset was detected for the SA02 zircon with an average δ³⁰Si value of −0.25 ± 0.16‰ (2SD, n = 12). The mean δ^94/90Zr (relative to IPGP-Zr) values were 0.02 ± 0.03‰ (2SD, n = 9) and 0.02 ± 0.04‰ (2SD, n = 9) for SA01 and SA02 zircons, respectively. Extensive homogeneity test of both Si and Zr isotopic compositions was performed on SA01 and SA02 zircons by spot analysis with fs-LA-MC-ICP-MS. The Si and Zr isotopic results for SA01 zircon showed good agreement with our SN-MC-ICP-MS measurements, as did the Zr isotope results of SA02 zircon. In spite of the inter-grain offset in the Si isotopic composition revealed by SN-MC-ICP-MS, intra-grain homogeneity was confirmed for SA02 zircon by the LA-MC-ICP-MS method. In situ analyses of SA01 and SA02 zircons yielded mean δ³⁰Si values of −0.24 ± 0.10‰ (2SD, n = 143) and −0.26 ± 0.12‰ (2SD, n = 135), and mean δ^94/90Zr values of 0.03 ± 0.09‰ (2SD, n = 153) and 0.02 ± 0.09‰ (2SD, n = 153), respectively. Both solution and in situ dataset demonstrated the suitability of SA01 for calibrating in situ zircon Si and Zr isotopic analysis. We suggest that SA02 zircon is also a suitable reference material for micro-beam Zr isotopic analysis as well as a monitor for in situ Si isotopic analysis. Furthermore, an analytical approach using the spot mode of fs-LA is presented in this study. In situ Si and Zr isotopic analysis may benefit from it for improving spatial resolution and precision.

中文翻译：

通过飞秒激光烧蚀 MC-ICP-MS 进一步表征 SA01 和 SA02 锆石参考材料中的 Si 和 Zr 同位素组成

在这里，我们通过多种技术分析方法提供了 SA01 和 SA02 锆石的 Si 和 Zr 同位素数据，以评估两种锆石参考材料在使用飞秒激光烧蚀多接收器电感耦合等离子体质谱法进行原位Si 和 Zr 同位素分析的适用性（ fs-LA-MC-ICP-MS）。通过溶液雾化 (SN) MC-ICP-MS 测定精确且准确的 Si 和 Zr 同位素组成。对两份 SA01 锆石溶液进行 15 次 SN-MC-ICP-MS Si 同位素测量得出一致的结果，平均 δ ³⁰ Si（相对于 NBS28）值为 -0.29 ± 0.08‰ (2SD)，而晶粒间有轻微偏移检测到 SA02 锆石的平均 δ ³⁰ Si 值为 -0.25 ± 0.16‰ (2SD,n = 12）。SA01 和 SA02 锆石的平均 δ ^94/90 Zr（相对于 IPGP-Zr）值分别为 0.02 ± 0.03‰（2SD，n = 9）和 0.02 ± 0.04‰（2SD，n = 9）。通过使用 fs-LA-MC-ICP-MS 进行点分析，对 SA01 和 SA02 锆石进行了 Si 和 Zr 同位素组成的广泛均匀性测试。SA01 锆石的 Si 和 Zr 同位素结果与我们的 SN-MC-ICP-MS 测量结果非常吻合，SA02 锆石的 Zr 同位素结果也是如此。尽管 SN-MC-ICP-MS 揭示了 Si 同位素组成的晶粒间偏移，但通过 LA-MC-ICP-MS 方法证实了 SAO2 锆石的晶粒内均匀性。SA01 和 SA02 锆石的原位分析得出平均 δ ³⁰Si 值为 -0.24 ± 0.10‰ (2SD, n = 143) 和 -0.26 ± 0.12‰ (2SD, n = 135)，平均 δ ^94/90 Zr 值为 0.03 ± 0.09‰ (2SD, n = 153) 和分别为 0.02 ± 0.09‰ (2SD, n = 153)。溶液和原位数据集均证明 SA01 适用于校准原位锆石 Si 和 Zr 同位素分析。我们建议 SA02 锆石也是微束 Zr 同位素分析的合适参考材料以及原位Si 同位素分析的监测器。此外，本研究还提出了一种使用 fs-LA 点模式的分析方法。就地 Si 和 Zr 同位素分析可能会从中受益，以提高空间分辨率和精度。

更新日期：2021-09-08

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