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Equatorial aberration for powder diffraction data collected by continuous-scan integration of a silicon strip X-ray detector
Powder Diffraction ( IF 0.3 ) Pub Date : 2021-09-07 , DOI: 10.1017/s0885715621000403
Takashi Ida 1
Affiliation  

The application of continuous-scan integration to collect X-ray diffraction data with a Si strip X-ray detector (CSI-SSXD) introduces additional effects on the peak shift and deformation of peak shape caused by the equatorial aberration. A deconvolutional method to correct the effects of equatorial aberration in CSI-SSXD data is proposed in this study. There are four critical angles related to the effects of spillover of the incident X-ray beam from the specimen face in the CSI-SSXD data. Exact values of cumulants of the equatorial aberration function are efficiently evaluated by 4 × 4 point two-dimensional Gauss–Legendre integral. A naïve two-step deconvolutional method has been applied to remove the effects of the first and third-order cumulants of the equatorial aberration function from the observed CSI-SSXD data. The performance of the algorithm has been tested by analyses of CSI-SSXD data of three LaB6 powder specimens with the widths of 20, 10, and 5 mm, collected with a diffractometer with the goniometer radius of 150 mm.

中文翻译:

硅条 X 射线探测器连续扫描积分收集的粉末衍射数据的赤道像差

应用连续扫描积分来使用 Si 带 X 射线检测器 (CSI-SSXD) 收集 X 射线衍射数据,会对由赤道像差引起的峰位移和峰形变形产生额外的影响。本研究提出了一种反卷积方法来校正 CSI-SSXD 数据中赤道像差的影响。在 CSI-SSXD 数据中,有四个临界角与来自试样面的入射 X 射线束的溢出效应相关。通过 4 × 4 点二维高斯-勒让德积分有效地评估赤道像差函数累积量的准确值。已经应用了一种简单的两步反卷积方法来消除观测到的 CSI-SSXD 数据中赤道像差函数的一阶和三阶累积量的影响。6用测角仪半径为 150 mm 的衍射仪采集宽度为 20、10 和 5 mm 的粉末样品。
更新日期:2021-09-07
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