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Grazing-incidence X-ray diffraction tomography for characterizing organic thin films
Journal of Applied Crystallography ( IF 5.2 ) Pub Date : 2021-09-04 , DOI: 10.1107/s1600576721007184 Esther H R Tsai 1 , Yu Xia 2 , Masafumi Fukuto 3 , Yueh-Lin Loo 2, 4 , Ruipeng Li 3
中文翻译：
用于表征有机薄膜的掠入射 X 射线衍射断层扫描
更新日期：2021-10-06
Journal of Applied Crystallography ( IF 5.2 ) Pub Date : 2021-09-04 , DOI: 10.1107/s1600576721007184 Esther H R Tsai 1 , Yu Xia 2 , Masafumi Fukuto 3 , Yueh-Lin Loo 2, 4 , Ruipeng Li 3
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中文翻译：
用于表征有机薄膜的掠入射 X 射线衍射断层扫描
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