In recent years, the investigation of adhesion properties of thin films on brittle substrates is receiving more attention due to the spread of thin film applications (coatings, protective layers, conductive layers in microelectronics, etc.). However, a basic approach for adhesion measurements proposed by Hutchinson and Suo almost three decades ago is still widely used due to its easy applicability. This approach uses thin film spontaneous buckling using residual compressive stresses in the film, however, it is based on Euler beam theory and accounts only for elastic behavior. Modern material combinations may lead to permanent plastic deformations, even under the controlled experimental conditions according to the elastic model. This work aims at investigating the plastic deformation influence on the experimental procedure according to Hutchinson and Suo by the means of the finite element analysis on the specific Mo-Cu-glass system. The deformations of spontaneously formed buckles are compared between purely elastic, (more realistic) elastic-plastic model and previously published experimental results together with quantification of the dissipated energy via the current finite element model. The comparison of the two numerical approaches shows non-negligible plastic deformations of the spontaneously formed buckles which has an effect on the film deformed shape (corresponding to the experimental observations) as well as on the portion of the shear loading at the delamination crack tip. This indicates that the plastic deformation during the buckling delamination may have some impact on the stability of the delamination crack.

近年来，由于薄膜应用（涂层、保护层、微电子中的导电层等）的广泛应用，对脆性基板上薄膜粘附性能的研究越来越受到关注。然而，Hutchinson 和 Suo 在大约 30 年前提出的粘附测量的基本方法由于其易于适用性而仍被广泛使用。这种方法利用薄膜中的残余压应力使用薄膜自发屈曲，但是，它基于欧拉梁理论并且仅考虑弹性行为。现代材料组合可能导致永久塑性变形，即使在根据弹性模型的受控实验条件下也是如此。这项工作旨在通过对特定 Mo-Cu-玻璃系统的有限元分析来研究塑性变形对 Hutchinson 和 Suo 的实验程序的影响。在纯弹性、（更现实的）弹塑性模型和先前公布的实验结果以及通过当前有限元模型对耗散能量进行量化的情况下，比较了自发形成的扣环的变形。两种数值方法的比较表明，自发形成的带扣的塑性变形不可忽略，这对薄膜变形形状（对应于实验观察）以及分层裂纹尖端的剪切载荷部分有影响。