Combining Modulated Techniques for the Analysis of Photosensitive Devices,Small Methods

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Combining Modulated Techniques for the Analysis of Photosensitive Devices
Small Methods ( IF 10.7 ) Pub Date : 2021-09-03 , DOI: 10.1002/smtd.202100661
Agustin O Alvarez ₁ , Sandheep Ravishankar ₂ , Francisco Fabregat-Santiago ₁

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Small-perturbation techniques such as impedance spectroscopy (IS), intensity-modulated photocurrent spectroscopy (IMPS), and intensity-modulated photovoltage spectroscopy (IMVS) are useful tools to characterize and model photovoltaic and photoelectrochemical devices. While the analysis of the impedance spectra is generally carried out using an equivalent circuit, the intensity-modulated spectroscopies are often analyzed through the measured characteristic response times. This makes the correlation between the two methods of analysis generally unclear. In this work, by taking into consideration the absorptance and separation efficiency, a unified theoretical framework and a procedure to combine the spectral analysis of the three techniques are proposed. Such a joint analysis of IS, IMPS, and IMVS spectra greatly reduces the sample space of possible equivalent circuits to model the device and allows obtaining parameters with high reliability. This theoretical approach is applied in the characterization of a silicon photodiode to demonstrate the validity of this methodology, which shows great potential to improve the quality of analysis of spectra obtained from frequency domain small-perturbation methods.

中文翻译：

结合调制技术分析光敏器件

阻抗谱 (IS)、强度调制光电流谱 (IMPS) 和强度调制光电压谱 (IMVS) 等小扰动技术是表征和模拟光伏和光电化学器件的有用工具。虽然阻抗谱的分析通常使用等效电路进行，但强度调制光谱通常通过测量的特征响应时间进行分析。这使得两种分析方法之间的相关性通常不清楚。在这项工作中，通过考虑吸收率和分离效率，提出了一个统一的理论框架和一个结合三种技术光谱分析的程序。IS、IMPS 的这种联合分析，和 IMVS 光谱极大地减少了对器件进行建模的可能等效电路的样本空间，并允许获得具有高可靠性的参数。这种理论方法应用于硅光电二极管的表征，以证明该方法的有效性，这显示出提高从频域小扰动方法获得的光谱分析质量的巨大潜力。

更新日期：2021-10-28

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