We have synthesized DyMnO₃ thin films using a sol gel method. Our goal was to evaluate the spatial patterns of the films as a function of the annealing temperature. The results reveal that from 800 °C, the films present pure orthorhombic structure with decreasing of nanocrystal size. The topography shows that films sintered at higher temperatures have greater surface roughness, negative asymmetries, high kurtosis, high peak densities and pointed peak shapes. These films also have anisotropic surfaces and are dominated by low spatial frequencies than films sintered at lower temperatures. However, fractal parameters show the sample sintered at 800 °C has greater spatial complexity, less heterogeneous nanotexture, ideal surface porosity, and greater topographic uniformity. These results suggest the film sintered at 800 °C has spatial configuration with the best topographic features which can be of great interest for technological application, regarding the processing control of perovskite rare-earth oxides-based semiconductor films.

我们合成了 DyMnO ₃使用溶胶凝胶法制备薄膜。我们的目标是评估薄膜的空间模式作为退火温度的函数。结果表明，从 800°C 开始，薄膜呈现纯正交结构，纳米晶尺寸减小。形貌表明，在较高温度下烧结的薄膜具有更大的表面粗糙度、负不对称性、高峰度、高峰密度和尖峰形状。这些薄膜还具有各向异性表面，并且与在较低温度下烧结的薄膜相比，其空间频率较低。然而，分形参数表明，在 800 °C 下烧结的样品具有更大的空间复杂性、更少的非均质纳米纹理、理想的表面孔隙率和更大的形貌均匀性。