Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is used for chemical analysis of surfaces. ToF-SIMS is a powerful tool for polymer science because it detects a broad mass range with good mass resolution, thereby distinguishing between polymers that have similar elemental compositions and/or the same types of functional groups. Chemical labeling techniques that enhance contrast, such as deuterating or staining one constituent, are generally unnecessary. ToF-SIMS can generate both two-dimensional images and three-dimensional depth profiles, where each pixel in an image is associated with a complete mass spectrum. This Review begins by introducing the principles of ToF-SIMS measurements, including instrumentation, modes of operation, strategies for data analysis, and strengths/limitations when characterizing polymer surfaces. The sections that follow describe applications in polymer science that benefit from characterization by ToF-SIMS, including thin films and coatings, polymer blends, composites, and electronic materials. The examples selected for discussion showcase the three standard modes of operation (spectral analysis, imaging, and depth profiling) and highlight practical considerations that relate to experimental design and data processing. We conclude with brief comments about broader opportunities for ToF-SIMS in polymer science.

中文翻译：

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使用飞行时间二次离子质谱法表征聚合物表面和界面

飞行时间二次离子质谱 (ToF-SIMS) 用于表面的化学分析。ToF-SIMS 是聚合物科学的强大工具，因为它可以检测具有良好质量分辨率的宽质量范围，从而区分具有相似元素组成和/或相同类型官能团的聚合物。增强对比度的化学标记技术，例如氘化或染色一种成分，通常是不必要的。ToF-SIMS 可以生成二维图像和三维深度剖面，其中图像中的每个像素都与完整的质谱相关联。本综述首先介绍了 ToF-SIMS 测量的原理，包括仪器、操作模式、数据分析策略以及表征聚合物表面时的优势/限制。以下部分描述了受益于 ToF-SIMS 表征的聚合物科学中的应用，包括薄膜和涂层、聚合物共混物、复合材料和电子材料。选择用于讨论的示例展示了三种标准操作模式（光谱分析、成像和深度剖析），并强调了与实验设计和数据处理相关的实际考虑。最后，我们简要评论了 ToF-SIMS 在聚合物科学中的更广泛机会。和深度剖析）并强调与实验设计和数据处理相关的实际考虑因素。最后，我们简要评论了 ToF-SIMS 在聚合物科学中的更广泛机会。和深度剖析）并强调与实验设计和数据处理相关的实际考虑因素。最后，我们简要评论了 ToF-SIMS 在聚合物科学中的更广泛机会。