Here, we demonstrate that impedance-derived capacitance spectroscopy is a useful method for measuring and analyzing the quantum of conductance and capacitance of a single-layer graphene sheet. Both quantum conductance and capacitance exhibit the expected traditional V-shape when measured as a function of bias potential (with the minima of both parameters being at the Dirac point) in a 1-Butyl-3-methylimidazolium tetrafluoroborate ionic liquid environment. Measurements were conducted at a specific low-frequency limit in which the conductance and capacitance were scanned as a function of bias potential to attain the quantum conductive and capacitive V-shapes. The V-shapes agree in terms of magnitude and profile with those reported in the literature using different methodologies and/or techniques. This validates impedance-derived capacitance spectroscopy as a suitable method to acquire key information of graphene and its derivatives. This method represents an alternative for rapid construction of both conductive and capacitive V-shapes of graphene in a single, simple experimental run.

在这里，我们证明阻抗衍生的电容光谱是测量和分析单层石墨烯片的电导和电容量子的有用方法。在 1-丁基-3-甲基咪唑鎓四氟硼酸盐离子液体环境中作为偏置电位的函数（两个参数的最小值位于狄拉克点）进行测量时，量子电导和电容都表现出预期的传统 V 形。测量是在特定的低频极限下进行的，其中电导和电容作为偏置电位的函数进行扫描，以获得量子导电和电容 V 形。V 形在大小和轮廓方面与使用不同方法和/或技术的文献中报道的一致。这验证了阻抗衍生电容光谱作为获取石墨烯及其衍生物关键信息的合适方法。这种方法代表了在单个简单的实验运行中快速构建导电和电容 V 形石墨烯的替代方法。