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Low temperature seamless joining of SiC using a Ytterbium film
Journal of the European Ceramic Society ( IF 5.8 ) Pub Date : 2021-08-27 , DOI: 10.1016/j.jeurceramsoc.2021.08.057
Lin-Kun Shi 1, 2 , Xiaobing Zhou 1 , Kai Xu 1 , Keke Chang 1 , Jian-Qing Dai 2 , Zhengren Huang 1 , Qing Huang 1
Affiliation  

Monolithic SiC, for the first time, was seamless joined at a low temperature of 1200 °C using electric field-assisted sintering technology. A 300 nm Yb coating on SiC was used as the joining filler to form Yb3Si2C2 via an in-situ reaction with the SiC. A liquid phase was formed by an eutectic reaction between Yb3Si2C2 and SiC. Almost completely seamless joints were formed by the precipitated SiC grains, which were fully consolidated with the SiC matrix with the help of in-situ formed liquid phase, followed by its elimination under the uniaxial pressure. The bending strength of the seamless joint joined at 1500 °C for 15 min was as high as 257.2 ± 31.1 MPa, which was comparable to the strength of the SiC matrix. As a result, the failure occurred in the matrix indicated a sound joint was obtained. The proposed low temperature seamless joining could potentially be used for joining of SiC-based composite.



中文翻译:

使用镱薄膜的 SiC 低温无缝接合

首次使用电场辅助烧结技术在 1200°C 的低温下无缝连接单片 SiC。使用 SiC 上的 300 nm Yb 涂层作为接合填料,通过与 SiC 的原位反应形成 Yb 3 Si 2 C 2。Yb 3 Si 2 C 2共晶反应形成液相和碳化硅。几乎完全无缝的接头由析出的 SiC 晶粒形成,在原位形成的液相的帮助下与 SiC 基体完全固结,然后在单轴压力下消除。无缝接头在 1500°C 下连接 15 分钟的弯曲强度高达 257.2±31.1 MPa,与 SiC 基体的强度相当。结果,在矩阵中发生的故障表明获得了良好的接头。所提出的低温无缝连接有可能用于连接 SiC 基复合材料。

更新日期:2021-10-06
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