Reflectometry with Polarized Neutrons on In Situ Grown Thin Films,Physica Status Solidi (B) - Basic Solid State Physics

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Reflectometry with Polarized Neutrons on In Situ Grown Thin Films
Physica Status Solidi (B) - Basic Solid State Physics ( IF 1.5 ) Pub Date : 2021-08-26 , DOI: 10.1002/pssb.202100153
Wolfgang Kreuzpaintner _{1,

2,

3} , Andreas Schmehl ₄ , Alexander Book ₃ , Thomas Mairoser ₄ , Jingfan Ye ₃ , Birgit Wiedemann ₃ , Sina Mayr ₃ , Jean-François Moulin ₅ , Jochen Stahn ₆ , Dustin A. Gilbert ₇ , Henrik Gabold ₃ , Zahra Inanloo-Maranloo ₃ , Michael Heigl ₄ , Sergey Masalovich ₈ , Robert Georgii ₈ , Manfred Albrecht ₄ , Jochen Mannhart ₉ , Peter Böni ₃

Affiliation

Originating from the demand for obtaining depth-resolved magnetization profiles from thin films and heterostructures, polarized neutron reflectometry (PNR) has developed into a unique research tool, which also finds application in the analysis of superconducting or soft matter thin films. While certain in situ sample environments such as gas-loading or humidity cells were quickly realized after PNR first emerged, preparing and growing thin magnetic films directly in the neutron beam could only be realized in recent years. Herein, a dedicated insight is given on the history and development of in situ thin film growth capabilities for PNR, from early pioneering experiments to the present day. The scientific and technological challenges as well as the advances of neutron sources, neutronics, and data treatment that have led to its realization are highlighted together with the unique research opportunities that it provides and recently obtained experimental results.

中文翻译：

原位生长薄膜上的偏振中子反射测量

源于从薄膜和异质结构中获得深度分辨磁化分布的需求，极化中子反射仪 (PNR) 已发展成为一种独特的研究工具，它也可应用于超导或软物质薄膜的分析。虽然在 PNR 首次出现后迅速实现了某些原位样品环境，例如气体加载或湿度电池，但直接在中子束中制备和生长磁性薄膜直到最近几年才得以实现。在此，对 PNR 的原位薄膜生长能力的历史和发展进行了专门的见解，从早期的开创性实验到现在。科学和技术挑战以及中子源、中子学、

更新日期：2021-08-26

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