An eccentric sol–gel method was used to synthesize the graphene oxide, reduced graphene oxide, Bi₂O₃ and graphene-doped Bi₂O₃. The samples were subjected to X-ray diffraction for the structural analysis. The structural parameters of all the samples were estimated and various strains like lattice strain, RMS strain, etc. and densities like X-ray density, dislocation and screw density were also calculated. Modified Scherrer method and W–H plot method are also used to estimate the average crystallite size and the intrinsic strain of all the synthesized materials.

中文翻译：

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石墨烯诱导的 Bi2O3 薄膜应变和密度的研究

采用偏心溶胶-凝胶法合成氧化石墨烯、还原氧化石墨烯、Bi ₂ O ₃和掺杂石墨烯的Bi ₂ O ₃。对样品进行 X 射线衍射以进行结构分析。估算了所有样品的结构参数，并计算了晶格应变、RMS 应变等各种应变和 X 射线密度、位错和螺旋密度等密度。改进的 Scherrer 方法和 W-H 绘图方法也用于估计所有合成材料的平均微晶尺寸和固有应变。