Poly (3,4-ethylene dioxythiophene) polystyrene sulfonate (PEDOT:PSS) thin films with tunable optical properties have shown great potential in optoelectronic device applications. Here, we present a new hybrid technology for accurately determining the dielectric properties of PEDOT:PSS films upon bias. Using electrochemical method together with numerical simulation of ellipsometry measurement, significant variations of the dielectric functions in a wide spectral range (400-1690 nm) under external voltage excitation are found. The ordinary dielectric constants increase under external voltage excitation, while the extraordinary dielectric constants remain unchanged. The simulation and experimental results are in a good agreement.

中文翻译：

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测定 PEDOT:PSS 从可见光到近红外区的动态介电函数

具有可调光学特性的聚（3,4-乙烯二氧噻吩）聚苯乙烯磺酸盐（PEDOT：PSS）薄膜在光电器件应用中显示出巨大的潜力。在这里，我们提出了一种新的混合技​​术，用于准确确定偏压时 PEDOT:PSS 薄膜的介电特性。使用电化学方法结合椭偏测量的数值模拟，发现在外部电压激发下，介电函数在宽光谱范围（400-1690 nm）内发生显着变化。普通介电常数在外部电压激励下增加，而非常介电常数保持不变。仿真和实验结果吻合良好。