Analyzing transient ESD device behavior with TLP equipment requires more attention for implementation and measurement details than the classical quasi-static TLP approach. Minimizing hardware parasitics reduces the de-embedding effort and optimizes the quality of the voltage and current measurements. We explore different methods and hardware options and highlight potential pitfalls.

中文翻译：

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使用 VF-TLP 进行瞬态响应分析的陷阱

与经典的准静态 TLP 方法相比，使用 TLP 设备分析瞬态 ESD 器件行为需要更多地关注实施和测量细节。最小化硬件寄生减少了去嵌入工作并优化了电压和电流测量的质量。我们探索了不同的方法和硬件选项，并强调了潜在的陷阱。