Loss of every bit in traditional logic circuits involves dissipation of power in the form of heat that evolve to the environment. Reversible logic is one of the alternatives that have capabilities to mitigate this dissipation by preventing the loss of bits. It also have the potential to broaden the horizon of futuristic reckon with its applications to quantum computation. Application of testing strategies to the logic circuits is a necessity that guarantees their true functioning where the researchers are at par with solutions for the upcoming challenges and agreements for reversible logic circuits. Novel methods of designing Toffoli, Fredkin and mixed Toffoli-Fredkin gates based reversible circuits for testability are put fourth in this article. The proposed designs are independent of the implementation techniques and can be brought into real hardware devices after obtaining a stable fabrication environment. The experimentation for the proposed models are performed on RCViewer and RevKit tools to verify the functionality and computation of cost metrics. Fault simulations are carried out using C++ and Java to calculate fault coverage in respective methodologies. The results confirmed that all the presented work outperforms existing state-of-art approaches.

中文翻译：

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Toffoli Fredkin 可逆电路的可测试设计

传统逻辑电路中每一位的损失都涉及以热量的形式散发到环境中的功率。可逆逻辑是一种能够通过防止位丢失来减轻这种耗散的替代方案。它还有可能通过其在量子计算中的应用来拓宽未来主义的视野。将测试策略应用于逻辑电路是必要的，以确保其真正发挥作用，研究人员与可逆逻辑电路即将面临的挑战和协议的解决方案相提并论。为可测试性设计基于 Toffoli、Fredkin 和混合 Toffoli-Fredkin 门的可逆电路的新方法在本文中排名第四。所提出的设计独立于实现技术，并在获得稳定的制造环境后可以带入真实的硬件设备。建议模型的实验在 RCViewer 和 RevKit 工具上进行，以验证成本指标的功能和计算。使用 C++ 和 Java 进行故障模拟，以计算各自方法中的故障覆盖率。结果证实，所有呈现的工作都优于现有的最先进方法。