The past decade has seen rapid advances in direct detector technology for electron microscopy. Direct detectors are now having an impact on a number of techniques in transmission electron microscopy (TEM), scanning electron microscopy, and scanning TEM (STEM), including single particle cryogenic electron microscopy, in situ TEM, electron backscatter diffraction, four-dimensional STEM, and electron energy loss spectroscopy. This article is intended to serve as an introduction to direct detector technology and an overview of the range of electron microscopy techniques that direct detectors are now being applied to.

中文翻译：

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直接探测器及其在材料科学电子显微镜中的应用

过去十年见证了电子显微镜直接检测器技术的快速发展。直接探测器现在对透射电子显微镜 (TEM)、扫描电子显微镜和扫描 TEM (STEM) 中的许多技术产生影响，包括单粒子低温电子显微镜、原位TEM、电子背散射衍射、四维 STEM和电子能量损失谱。本文旨在介绍直接检测器技术，并概述直接检测器现在所应用的电子显微镜技术范围。