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Influence of sheet resistance and strip width on the detection efficiency saturation in micron-wide superconducting strips and large-area meanders
Superconductor Science and Technology ( IF 3.7 ) Pub Date : 2021-06-29 , DOI: 10.1088/1361-6668/ac0950
Yu P Korneeva 1 , N N Manova 1 , M A Dryazgov 1, 2 , N O Simonov 1 , Ph I Zolotov 1, 2, 3 , A A Korneev 1, 2
Affiliation  

We report our study of detection efficiency (DE) saturation in wavelength range 400–1550 nm for the NbN superconducting microstrip single-photon detectors (SMSPDs) featuring the strip width up to 3 m. We observe an expected decrease of the DE saturation plateau with the increase of photon wavelength and decrease of film sheet resistance. At 1.7 K temperature DE saturation can be clearly observed at 1550 nm wavelength in strip with the width up to 2 m when sheet resistance of the film is above 630 Ω sq−1. In such strips the length of the saturation plateau almost does not depend on the strip width. We used these films to make meander-shaped detectors with the light sensitive area from 20 20 m2 to a circle 50 m in diameter. In the latter case, the detector with the strip width of 0.49 m demonstrates saturation of DE up to 1064 nm wavelength. Although DE at 1310 and 1550 nm is not saturated, it is as high as 60%. The response time is limited by the kinetic inductance and equals to 20 ns (by 1/e decay), timing jitter is 44 ps. When coupled to multi-mode fibre large-area meanders demonstrate significantly higher dark count rate which we attribute to thermal background photons, thus advanced filtering technique would be required for practical applications.



中文翻译:

薄层电阻和条带宽度对微米宽超导条带和大面积弯曲检测效率饱和的影响

我们报告了我们对 NbN 超导微带单光子探测器 (SMSPD) 在 400-1550 nm 波长范围内的探测效率 (DE) 饱和度的研究,该探测器的条带宽度高达 3 米。我们观察到随着光子波长的增加和薄膜薄层电阻的降低,DE 饱和平台预期减少。在 1.7 K 温度下,在 1550 nm 波长处可以清楚地观察到 DE 饱和,条带宽度可达 2m 当薄膜的薄层电阻高于 630 Ω sq -1 时。在这种带钢中,饱和平台的长度几乎不取决于带钢宽度。我们用这些薄膜制作了光敏面积从 20 20m 2到一个圆 50米直径。在后一种情况下,检测器的条宽为 0.49m 表明 DE 达到 1064 nm 波长的饱和度。虽然 1310 和 1550 nm 处的 DE 未饱和,但高达 60%。响应时间受动态电感限制,等于 20 ns(按 1/ e衰减),时序抖动为 44 ps。当与多模光纤耦合时,大面积弯曲表现出显着更高的暗计数率,我们将其归因于热背景光子,因此实际应用需要先进的过滤技术。

更新日期:2021-06-29
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