Superconducting circuit testing and materials loss characterization requires robust and reliable methods for the extraction of internal and coupling quality factors of microwave resonators. A common method, imposed by limitations on the device design or experimental configuration, is the single-port reflection geometry, i.e. reflection-mode. However, impedance mismatches in cryogenic systems must be accounted for through calibration of the measurement chain while it is at low temperatures. In this paper, we demonstrate a data-based, single-port calibration using commercial microwave standards and a vector network analyzer with samples at millikelvin temperature in a dilution refrigerator, making this method useful for measurements of quantum phenomena. Finally, we cross reference our data-based, single-port calibration and reflection measurement with over-coupled 2D- and 3D-resonators against well established two-port techniques corroborating the validity of our method.

超导电路测试和材料损耗表征需要稳健可靠的方法来提取微波谐振器的内部和耦合品质因数。由于设备设计或实验配置的限制，一种常见的方法是单端口反射几何，即反射模式。然而，低温系统中的阻抗失配必须通过测量链在低温下的校准来解决。在本文中，我们展示了使用商业微波标准和矢量网络分析仪在稀释冰箱中使用毫开尔文温度的样品进行基于数据的单端口校准，使该方法可用于测量量子现象。最后，我们交叉引用我们基于数据的，