The commonly used data reduction methods to determine shear wave velocity (V_s) require the depth interval of the V_s profile to be the same as the in-situ testing interval. The V_s values derived in this way are the mean values within the depth intervals. However, the in-situ multilayer interfaces do not always coincide with the predetermined testing depths, and the materials may change dramatically across layers and thus the above interpretation methods may not always produce representative soil properties. In this study, a modified refracted ray path method for more flexible V_s calculation is proposed. The method takes advantage of the routine cone penetration testing data obtained in SCPT tests and applies a combined approach for the soil layer identification using both the corrected cone tip resistance (q_t) and the Soil Behavior Type Index (I_c) as indicators. V_s is then calculated using the Snell's law based on the original shear wave travel times and the newly identified layer profiles. The proposed method can avoid the error caused by crossing the multilayer boundaries and provide a more accurate prediction of soil type and the corresponding stiffness properties. The data show that by using the proposed method, the accuracy of the estimated V_s can be improved by up to 77% for a soil layer with interface not located at testing depths, as compared to V_s obtained from the conventional methods.

常用的确定横波速度（V _s）的数据缩减方法要求V _s剖面的深度间隔与原位测试间隔相同。以这种方式导出的V _s值是深度区间内的平均值。然而，原位多层界面并不总是与预定的测试深度重合，材料可能会在各层之间发生显着变化，因此上述解释方法可能并不总是产生具有代表性的土壤特性。在这项研究中，一种改进的折射光线路径方法，用于更灵活的V _s建议计算。该方法采用的程序锥入度测试中测试SCPT获得的数据的优点，适用的组合方法同时使用校正后的锥尖电阻（土壤层识别q_吨）和土壤行为类型指数（我_Ç）作为指标。然后根据原始剪切波传播时间和新识别的层剖面，使用斯涅尔定律计算V _s。所提出的方法可以避免跨越多层边界引起的误差，并提供更准确的土壤类型和相应刚度特性的预测。数据表明，通过使用所提出的方法，估计的V _s的准确性与传统方法获得的V _s相比，对于界面未位于测试深度的土层，可提高 77% 。